Sounds like SEE (single event effect) if it’s something fixable by software.
TID (total ionizing dose) is another flavor of radiation effect on components, but that’s a total lifetime effect where it slowly degrades. Using rad hard parts or adding extra shielding is the main fix.
SEEs are transient effects from high energy charged particles that can cause bit flips and latch ups in circuitry depending on where the particle hits and deposits it’s charge in the circuitry. Extra shielding can help prevent these as well, but they can also be mitigated in software, sometimes the fix is just error detection, or power cycling a specific section of circuitry to clear a latchup
Sounds like SEE (single event effect) if it’s something fixable by software.
TID (total ionizing dose) is another flavor of radiation effect on components, but that’s a total lifetime effect where it slowly degrades. Using rad hard parts or adding extra shielding is the main fix.
SEEs are transient effects from high energy charged particles that can cause bit flips and latch ups in circuitry depending on where the particle hits and deposits it’s charge in the circuitry. Extra shielding can help prevent these as well, but they can also be mitigated in software, sometimes the fix is just error detection, or power cycling a specific section of circuitry to clear a latchup